IEEE 24-Bus System

The IEEE 24-bus reliability test system was developed by the IEEE reliability subcommittee and published in 1979 as a benchmark for testing various reliability analysis methods. The three reliability test systems are IEEE one-area, IEEE two-area, and IEEE three-area.

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This power system dataset is synthetic and does not represent any actual grid. It is provided by Texas A&M University researchers free for commercial or non-commercial use. We do encourage those who use these datasets to: (1) Fill out the information in the form below, and (2) Cite the appropriate papers when using the datasets. https://electricgrids.engr.tamu.edu/references/

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